Photoluminescent Si and Ge nanoparticles by reactive PLD
نویسندگان
چکیده
منابع مشابه
Comparative STM and RHEED studies of Ge/Si(001) and Si/Ge/Si(001) surfaces
Although epitaxial growth has been traditionally monitored by reciprocal space techniques, such as reflection highenergy electron diffraction (RHEED), the development of surface-sensitive imaging techniques, such as scanning tunneling microscopy (STM), allows for monitoring in the real-space. RHEED averages information over relatively large sample regions, and is thus more representative of the...
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ژورنال
عنوان ژورنال: Journal of Physics: Conference Series
سال: 2007
ISSN: 1742-6588,1742-6596
DOI: 10.1088/1742-6596/59/1/041